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Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach
Material type:
TextSeries: Circuits, devices and systems series ; 19Publication details: London : Institution of Engineering and Technology, ©2008.Description: xx, 389 p. : ill. ; 24 cm (Paperback)ISBN: - 9780863417450
- 621.381502 SUN / B
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IIT - Dharwad | Electronics, Communications Engineering | 621.381502 SUN / B (Browse shelf(Opens below)) | Available | 1096 |
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| 621.3815 SED / B Microelectronic circuits : | 621.3815 SED / G Microelectronic circuits : | 621.3815 UHR / B Analog filters in nanometer CMOS | 621.381502 SUN / B Test and diagnosis of analogue, mixed-signal and RF integrated circuits : | 621.38152 CAM / G The science and engineering of microelectronic fabrication | 621.38152 PIE / B Semiconductor device fundamentals : with computer-based exercises and homework problems | 621.38152 PIE / B Semiconductor device fundamentals : with computer-based exercises and homework problems |
Includes bibliographical references and index.
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