MARC details
000 -LEADER |
fixed length control field |
01057cam a22002777i 4500 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
OSt |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20201210162913.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
140630s2008 enka b 001 0 eng |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9780863417450 |
040 ## - CATALOGING SOURCE |
Transcribing agency |
|
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
621.381502 |
Item number |
SUN / B |
245 00 - TITLE STATEMENT |
Title |
Test and diagnosis of analogue, mixed-signal and RF integrated circuits : |
Remainder of title |
the system on chip approach |
260 ## - PUBLICATION, DISTRIBUTION, ETC. |
Place of publication, distribution, etc. |
London : |
Name of publisher, distributor, etc. |
Institution of Engineering and Technology, |
Date of publication, distribution, etc. |
©2008. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xx, 389 p. : |
Other physical details |
ill. ; |
Dimensions |
24 cm (Paperback) |
490 ## - SERIES STATEMENT |
Series statement |
Circuits, devices and systems series ; |
Volume/sequential designation |
19 |
504 ## - BIBLIOGRAPHY, ETC. NOTE |
Bibliography, etc. note |
Includes bibliographical references and index. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Linear integrated circuits |
General subdivision |
Testing. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Mixed signal circuits |
General subdivision |
Testing. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Radio frequency integrated circuits |
General subdivision |
Testing. |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Linear integrated circuits / Testing. |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Mixed signal circuits / Testing. |
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Radio frequency integrated circuits / Testing. |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Sun, Yichuang |
Relator term |
Author |
710 2# - ADDED ENTRY--CORPORATE NAME |
Corporate name or jurisdiction name as entry element |
Institution of Engineering and Technology |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Source of classification or shelving scheme |
Dewey Decimal Classification |
Koha item type |
Book |