Test and diagnosis of analogue, mixed-signal and RF integrated circuits : (Record no. 547)

MARC details
000 -LEADER
fixed length control field 01057cam a22002777i 4500
003 - CONTROL NUMBER IDENTIFIER
control field OSt
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20201210162913.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 140630s2008 enka b 001 0 eng
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780863417450
040 ## - CATALOGING SOURCE
Transcribing agency
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.381502
Item number SUN / B
245 00 - TITLE STATEMENT
Title Test and diagnosis of analogue, mixed-signal and RF integrated circuits :
Remainder of title the system on chip approach
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. London :
Name of publisher, distributor, etc. Institution of Engineering and Technology,
Date of publication, distribution, etc. ©2008.
300 ## - PHYSICAL DESCRIPTION
Extent xx, 389 p. :
Other physical details ill. ;
Dimensions 24 cm (Paperback)
490 ## - SERIES STATEMENT
Series statement Circuits, devices and systems series ;
Volume/sequential designation 19
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references and index.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Linear integrated circuits
General subdivision Testing.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Mixed signal circuits
General subdivision Testing.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Radio frequency integrated circuits
General subdivision Testing.
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Linear integrated circuits / Testing.
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Mixed signal circuits / Testing.
650 #4 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Radio frequency integrated circuits / Testing.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Sun, Yichuang
Relator term Author
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element Institution of Engineering and Technology
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Dewey Decimal Classification
Koha item type Book
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Collection code Home library Current library Date acquired Source of acquisition Cost, normal purchase price Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
    Dewey Decimal Classification     Electronics, Communications Engineering IIT - Dharwad IIT - Dharwad 11/12/2017 National Book Stall 995.00   621.381502 SUN / B 1096 21/03/2019 11/12/2017 Book

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