000			01057cam a22002777i 4500
999			_c547 _d547
003			OSt
005			20201210162913.0
008			140630s2008 enka b 001 0 eng
020			_a9780863417450
040			_c
082	0	4	_a621.381502 _bSUN / B
245	0	0	_aTest and diagnosis of analogue, mixed-signal and RF integrated circuits : _bthe system on chip approach
260			_aLondon : _bInstitution of Engineering and Technology, _c©2008.
300			_axx, 389 p. : _bill. ; _c24 cm (Paperback)
490			_aCircuits, devices and systems series ; _v19
504			_aIncludes bibliographical references and index.
650		0	_aLinear integrated circuits _xTesting.
650		0	_aMixed signal circuits _xTesting.
650		0	_aRadio frequency integrated circuits _xTesting.
650		4	_aLinear integrated circuits / Testing.
650		4	_aMixed signal circuits / Testing.
650		4	_aRadio frequency integrated circuits / Testing.
700	1		_aSun, Yichuang _eAuthor
710	2		_aInstitution of Engineering and Technology
942			_2ddc _cBK