TY  - BOOK
AU  - Sun,Yichuang
ED  - Institution of Engineering and Technology
TI  - Test and diagnosis of analogue, mixed-signal and RF integrated circuits: the system on chip approach
T2  - Circuits, devices and systems series
SN  - 9780863417450
U1  - 621.381502 
PY  - 2008///
CY  - London
PB  - Institution of Engineering and Technology
KW  - Linear integrated circuits
KW  - Testing
KW  - Mixed signal circuits
KW  - Radio frequency integrated circuits
KW  - Linear integrated circuits / Testing
KW  - Mixed signal circuits / Testing
KW  - Radio frequency integrated circuits / Testing
N1  - Includes bibliographical references and index
ER  -