Test and diagnosis of analogue, mixed-signal and RF integrated circuits :  the system on chip approach 

 - London :  Institution of Engineering and Technology,  ©2008. 
 - xx, 389 p. :  ill. ;  24 cm (Paperback) 
 - Circuits, devices and systems series ;  19 .
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9780863417450 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Linear integrated circuits--Testing.<br/>Mixed signal circuits--Testing.<br/>Radio frequency integrated circuits--Testing.<br/>Linear integrated circuits / Testing.<br/>Mixed signal circuits / Testing.<br/>Radio frequency integrated circuits / Testing.
<br/><br/><label>Dewey Class. No.: </label>621.381502  / SUN / B