Defects in microelectronic materials and devices 

 - Boca Raton :  CRC Press,  ©2009. 
 - xvi, 753 p. :  ill. ;  26 cm (Hardbound) 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9781420043761 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microelectronics--Materials--Testing.<br/>Metal oxide semiconductor field-effect transistors--Testing.<br/>Integrated circuits--Defects.
<br/><br/><label>Dewey Class. No.: </label>621.381  / FLE / B